Inventor · disambiguated record
Eyal Odiz
Also filed as: Odiz Eyal
6 granted patents·1 pending application·26 citations·filing 2016–2020
78Inventor score
Top patents by PatentIndex Score
7 records- 0187US10372858B2Design-for-testability (DFT) insertion at register-transfer-level (RTL)SYNOPSYS INC·Filed 2017·Granted Aug 6, 2019·7 cites·14 claims
- 0285US9697314B1Identifying and using slices in an integrated circuit (IC) designSYNOPSYS INC·Filed 2016·Granted Jul 4, 2017·6 cites·15 claims
- 0385US9652573B1Creating and using a wide-gate data structure to represent a wide-gate in an integrated circuit (IC) designSYNOPSYS INC·Filed 2016·Granted May 16, 2017·6 cites·12 claims
- 0481US9690890B1Creating and using a wide-bus data structure to represent a wide-bus in an integrated circuit (IC) designSYNOPSYS INC·Filed 2016·Granted Jun 27, 2017·4 cites·12 claims
- 0573US10643012B1Concurrent formal verification of logic synthesisSYNOPSYS INC·Filed 2019·Granted May 5, 2020·3 cites·21 claims
- 0650US2020357526A1Systems and methods for clinical guidance of genetic testing for patients via a mobile applicationHYGEA PREC MEDICINE INC·Filed 2020·Application pending·0 cites
- 0738US10354032B2Optimizing an integrated circuit (IC) design comprising at least one wide-gate or wide-busSYNOPSYS INC·Filed 2016·Granted Jul 16, 2019·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →