Inventor · disambiguated record
Hiroki Okuno
Also filed as: OKUNO HIROKI
9 granted patents·5 pending applications·51 citations·filing 2003–2020
84Inventor score
Top patents by PatentIndex Score
14 records- 0185US8941932B2Fresnel lensKAMIYAMA HARUKI·Filed 2012·Granted Jan 27, 2015·15 cites·4 claims
- 0281US7068350B2Exposure apparatus and stage device, and device manufacturing methodNIKON CORP·Filed 2003·Granted Jun 27, 2006·27 cites·14 claims
- 0379US8901512B2Particle detectorFUJITA HIDEAKI·Filed 2012·Granted Dec 2, 2014·4 cites·1 claims
- 0472US9057703B2Particle detection deviceSUZUKI AKIHIRO·Filed 2012·Granted Jun 16, 2015·2 cites·6 claims
- 0570US9612200B2Particle detectorSHARP KK·Filed 2014·Granted Apr 4, 2017·1 cites·5 claims
- 0660US9700920B2Cleaning tool for collection member, particle detector, and manufacturing method for cleaning tool for collection memberSHARP KK·Filed 2013·Granted Jul 11, 2017·1 cites·8 claims
- 0758US8872653B2Display control deviceOKUNO HIROKI·Filed 2010·Granted Oct 28, 2014·1 cites·12 claims
- 0848US12249438B2Beam target and beam target systemRIKEN·Filed 2020·Granted Mar 11, 2025·0 cites·6 claims
- 0947US2012120379A1System and method for controlling the distortion of a reticlePHILLIPS ALTON H·Filed 2011·Application pending·0 cites
- 1041US11432394B2Accelerator and accelerator systemRIKEN·Filed 2018·Granted Aug 30, 2022·0 cites·7 claims
- 1137US2012315666A1Detection apparatus and method for detecting airborne biological particlesFUJIOKA KAZUSHI·Filed 2010·Application pending·0 cites
- 1236US2015276257A1Filter for electric dust collector, electric dust collector, and air conditionerFUJITSU GENERAL LTD·Filed 2015·Application pending·0 cites
- 1336US2016332169A1Electric dust collection device and air conditioner using the sameFUJITSU GENERAL LTD·Filed 2015·Application pending·0 cites
- 1431US2012136584A1Detection apparatus and detection method for detecting microorganismsBAN KAZUO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →