Inventor · disambiguated record
Hiroaki Ohkubo
Also filed as: OHKUBO HIROAKI
54 granted patents·7 pending applications·561 citations·filing 1994–2016
98Inventor score
Files withNEC ELECTRONICS CORP31NEC CORP15OHKUBO HIROAKI6RENESAS ELECTRONICS CORP5FURUMIYA MASAYUKI2
Top patents by PatentIndex Score
61 records- 0196US6635912B2CMOS image sensor and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2001·Granted Oct 21, 2003·115 cites·3 claims
- 0290US6545360B1Semiconductor device and manufacturing method thereofNEC CORP·Filed 2000·Granted Apr 8, 2003·58 cites·17 claims
- 0383US6639293B2Solid-state imaging deviceNEC ELECTRONICS CORP·Filed 2001·Granted Oct 28, 2003·32 cites·11 claims
- 0482US6841843B2Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2004·Granted Jan 11, 2005·29 cites·9 claims
- 0581US6879234B2Semiconductor integrated circuitNEC ELECTRONICS CORP·Filed 2003·Granted Apr 12, 2005·29 cites·9 claims
- 0681US5521860ACMOS static memoryNEC CORP·Filed 1994·Granted May 28, 1996·49 cites·3 claims
- 0780US7973383B2Semiconductor integrated circuit device having a decoupling capacitorRENESAS ELECTRONICS CORP·Filed 2007·Granted Jul 5, 2011·7 cites·5 claims
- 0878US8330254B2Semiconductor deviceFURUMIYA MASAYUKI·Filed 2009·Granted Dec 11, 2012·6 cites·3 claims
- 0978US7800668B2Solid state imaging device including a light receiving portion with a silicided surfaceNEC ELECTRONICS CORP·Filed 2006·Granted Sep 21, 2010·3 cites·14 claims
- 1075US8188566B2Semiconductor integrated circuit deviceFURUMIYA MASAYUKI·Filed 2011·Granted May 29, 2012·3 cites·7 claims
- 1175US7417277B2Semiconductor integrated circuit and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2006·Granted Aug 26, 2008·6 cites·14 claims
- 1274US7345347B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Mar 18, 2008·6 cites·7 claims
- 1373US7239002B2Integrated circuit deviceNEC CORP·Filed 2005·Granted Jul 3, 2007·6 cites·20 claims
- 1473US6160298AFull CMOS SRAM cell comprising Vcc and Vss buses on both sides of each of complementary data lines on a single levelNEC CORP·Filed 1997·Granted Dec 12, 2000·44 cites·19 claims
- 1572US6576882B2Image sensorNEC ELECTRONICS CORP·Filed 2002·Granted Jun 10, 2003·9 cites·4 claims
- 1671US9305253B2Interface IC and memory card including the sameRENESAS ELECTRONICS CORP·Filed 2013·Granted Apr 5, 2016·2 cites·17 claims
- 1771US7391092B2Integrated circuit including a temperature monitor element and thermal conducting layerNEC ELECTRONICS CORP·Filed 2005·Granted Jun 24, 2008·5 cites·18 claims
- 1871US6806522B2CMOS image sensor and manufacturing method for the sameNEC ELECTRONICS CORP·Filed 2001·Granted Oct 19, 2004·16 cites·22 claims
- 1970US7091576B2Inductor for semiconductor integrated circuit and method of fabricating the sameNEC ELECTRONICS CORP·Filed 2003·Granted Aug 15, 2006·14 cites·1 claims
- 2069US7256456B2SOI substrate and semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2003·Granted Aug 14, 2007·13 cites·23 claims
- 2166US8810699B2Solid state imaging device including a light receiving portion with a silicided surfaceOHKUBO HIROAKI·Filed 2012·Granted Aug 19, 2014·0 cites·15 claims
- 2266US7462921B2Integrated circuit device, method of manufacturing the same and method of forming vanadium oxide filmNEC CORP·Filed 2005·Granted Dec 9, 2008·2 cites·20 claims
- 2365US6133586ASemiconductor memory device and method of fabricating the sameNEC CORP·Filed 1997·Granted Oct 17, 2000·20 cites·5 claims
- 2463US7579673B2Semiconductor device having electrical fuseNEC ELECTRONICS CORP·Filed 2006·Granted Aug 25, 2009·2 cites·17 claims
- 2563US7544940B2Semiconductor device including vanadium oxide sensor element with restricted current densityNEC ELECTRONICS CORP·Filed 2005·Granted Jun 9, 2009·2 cites·9 claims
- 2663US6849913B2Integrated circuit including an inductor, active layers with isolation dielectrics, and multiple insulation layersNEC ELECTRONICS CORP·Filed 2002·Granted Feb 1, 2005·10 cites·10 claims
- 2762US8130297B2Solid state imaging device including a light receiving portion with a silicided surfaceOHKUBO HIROAKI·Filed 2010·Granted Mar 6, 2012·0 cites·20 claims
- 2861US7741692B2Integrated circuit device with temperature monitor membersNEC ELECTRONICS CORP·Filed 2005·Granted Jun 22, 2010·2 cites·10 claims
- 2960US7211870B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted May 1, 2007·2 cites·6 claims
- 3057US7432545B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Oct 7, 2008·1 cites·13 claims
- 3157US6707116B2Integrated circuit and manufacturing method thereforNEC ELECTRONICS CORP·Filed 2002·Granted Mar 16, 2004·7 cites·9 claims
- 3255US7095072B2Semiconductor device with wiring layers forming a capacitorNEC ELECTRONICS CORP·Filed 2004·Granted Aug 22, 2006·6 cites·20 claims
- 3354US9846831B2Interface IC and memory card including the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Dec 19, 2017·0 cites·20 claims
- 3454US8461907B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2012·Granted Jun 11, 2013·0 cites·12 claims
- 3554US7777298B2Semiconductor device and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2009·Granted Aug 17, 2010·0 cites·11 claims
- 3653US7432170B2Semiconductor device and fabrication method thereofNEC ELECTRONICS CORP·Filed 2004·Granted Oct 7, 2008·5 cites·8 claims
- 3753US7030919B2Solid state image pick-up deviceNEC ELECTRONICS CORP·Filed 2001·Granted Apr 18, 2006·6 cites·8 claims
- 3852US8339182B2Semiconductor deviceOHKUBO HIROAKI·Filed 2012·Granted Dec 25, 2012·0 cites·8 claims
- 3951US7288826B2Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2003·Granted Oct 30, 2007·3 cites·16 claims
- 4051US2009212385A1Semiconductor device including vanadium oxide sensor element with restricted current densityNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 4150US8217709B2Semiconductor deviceOHKUBO HIROAKI·Filed 2006·Granted Jul 10, 2012·0 cites·16 claims
- 4249US8416330B2Solid state imaging device for imaging an object placed thereonOHKUBO HIROAKI·Filed 2012·Granted Apr 9, 2013·0 cites·4 claims
- 4349US2007262383A1Soi substrate and semiconductor integrated ciruit deviceNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 4447US8357990B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Jan 22, 2013·0 cites·28 claims
- 4546US6009010AStatic semiconductor memory device having data lines in parallel with power supply linesNEC CORP·Filed 1998·Granted Dec 28, 1999·8 cites·17 claims
- 4646US5811858ASemiconductor integrated circuit device having gate or active area patterned to allow for misalignmentNEC CORP·Filed 1996·Granted Sep 22, 1998·10 cites·4 claims
- 4745US2002000508A1Image sensorNEC CORP·Filed 2001·Application pending·0 cites
- 4844US8233063B2Solid state image pick-up device for imaging an object placed thereonOHKUBO HIROAKI·Filed 2005·Granted Jul 31, 2012·0 cites·5 claims
- 4943US2007126113A1Semiconductor deviceNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
- 5041US8534563B2Interface IC and memory card including the sameNAKASHIBA YASUTAKA·Filed 2010·Granted Sep 17, 2013·0 cites·17 claims
Showing the top 50 of 61 patent records by PatentIndex Score.
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