Inventor · disambiguated record
Ron Bar-Or
Also filed as: BAR-OR RON
3 granted patents·2 pending applications·2 citations·filing 2015–2024
49Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5
Top patents by PatentIndex Score
5 records- 0188US11662324B1Three-dimensional surface metrology of wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 30, 2023·2 cites·20 claims
- 0257US2025391707A1Method and system for 3d reconstruction of wafer structure by diagonal millingAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0355US2025391114A1Algorithm for 3d reconstruction of diagonally cut semiconductor logic structureAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0445US9835563B2Evaluation system and a method for evaluating a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
- 0535US10446434B2Chuck for supporting a waferAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Oct 15, 2019·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →