Inventor · disambiguated record
Daniel Skiera
Also filed as: SKIERA DANIEL
2 granted patents·2 pending applications·4 citations·filing 2008–2011
41Inventor score
Top patents by PatentIndex Score
4 records- 0174US8705837B2Method for inspection and detection of defects on surfaces of disc-shaped objects and computer system with a software product for carrying out the methodMICHELSSON DETLEF·Filed 2011·Granted Apr 22, 2014·4 cites·23 claims
- 0243US2008249728A1Method for detecting defects on the back side of a semiconductor waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Application pending·0 cites
- 0340US8090185B2Method for optical inspection, detection and visualization of defects on disk-shaped objectsFRIEDRICH RALF·Filed 2008·Granted Jan 3, 2012·0 cites·20 claims
- 0431US2008208523A1Method of determining geometric parameters of a waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →