Inventor · disambiguated record
Jayashree Saxena
Also filed as: SAXENA JAYASHREE
14 granted patents·3 pending applications·150 citations·filing 1999–2016
93Inventor score
Top patents by PatentIndex Score
17 records- 0197US7954030B2Automatable scan partitioning for low power using external controlTEXAS INSTRUMENTS INC·Filed 2010·Granted May 31, 2011·19 cites·3 claims
- 0290US6766487B2Divided scan path with decode logic receiving select control signalsTEXAS INSTRUMENTS INC·Filed 2001·Granted Jul 20, 2004·46 cites·3 claims
- 0387US7580807B2Test protocol manager for massive multi-site testTEXAS INSTRUMENTS INC·Filed 2007·Granted Aug 25, 2009·17 cites·12 claims
- 0486US10107859B1Determining test conditions for at-speed transition delay fault tests on semiconductor devicesANORA LLC·Filed 2016·Granted Oct 23, 2018·5 cites·20 claims
- 0585US7219284B2Decode logic selecting IC scan path partsTEXAS INSTRUMENTS INC·Filed 2004·Granted May 15, 2007·18 cites·3 claims
- 0681US8769358B2Decoder providing separate clock and enable for scan path segmentsTEXAS INSTRUMENTS INC·Filed 2013·Granted Jul 1, 2014·2 cites·4 claims
- 0780US8539294B2Decode logic driving segmented scan cells with clocks and enablesTEXAS INSTRUMENTS INC·Filed 2012·Granted Sep 17, 2013·2 cites·2 claims
- 0874US8321729B2Divided scan path segments maintaining test pattern of stimulus/response connectionsSAXENA JAYASHREE·Filed 2011·Granted Nov 27, 2012·2 cites·2 claims
- 0974US7870451B2Automatable scan partitioning for low power using external controlTEXAS INSTRUMENTS INC·Filed 2009·Granted Jan 11, 2011·3 cites·3 claims
- 1070US7617429B2Automatable scan partitioning for low power using external controlTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 10, 2009·3 cites·3 claims
- 1162US9103882B2Automatable scan partitioning for low power using external controlTEXAS INSTRUMENTS INC·Filed 2014·Granted Aug 11, 2015·0 cites·4 claims
- 1261US7324914B2Timing closure for system on a chip using voltage drop based standard delay formatsTEXAS INSTRUMENTS INC·Filed 2004·Granted Jan 29, 2008·10 cites·10 claims
- 1353US6618830B1System and method for pruning a bridging diagnostic listTEXAS INSTRUMENTS INC·Filed 1999·Granted Sep 9, 2003·21 cites·19 claims
- 1450US7865849B2System and method for estimating test escapes in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jan 4, 2011·2 cites·18 claims
- 1533US2003149913A1Method and apparatus for efficient burn-in of electronic circuitsFiled 2002·Application pending·0 cites
- 1632US2006107144A1Power reduction in module-based scan testingSAXENA JAYASHREE·Filed 2005·Application pending·0 cites
- 1730US2002170010A1Power reduction in module-based scan testingFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →