Inventor · disambiguated record
William E. Guthrie
Also filed as: GUTHRIE WILLIAM · GUTHRIE WILLIAM E
11 granted patents·1 pending application·30 citations·filing 1999–2023
86Inventor score
Top patents by PatentIndex Score
12 records- 0196US11062878B2Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2020·Granted Jul 13, 2021·5 cites·15 claims
- 0291US11756765B2Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2021·Granted Sep 12, 2023·2 cites·16 claims
- 0390US10748744B1Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2019·Granted Aug 18, 2020·5 cites·14 claims
- 0484US10460071B2Shaped beam lithography including temperature effectsD2S INC·Filed 2016·Granted Oct 29, 2019·4 cites·17 claims
- 0580US12243712B2Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2023·Granted Mar 4, 2025·0 cites·17 claims
- 0680US10564853B2System and method for locality detection to identify read or write streams in a memory deviceWESTERN DIGITAL TECH INC·Filed 2017·Granted Feb 18, 2020·4 cites·22 claims
- 0779US11886166B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2023·Granted Jan 30, 2024·0 cites·20 claims
- 0872US2023124768A1Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2022·Application pending·0 cites
- 0971US11592802B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2020·Granted Feb 28, 2023·0 cites·18 claims
- 1069US11604451B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2021·Granted Mar 14, 2023·0 cites·19 claims
- 1161US10884395B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2018·Granted Jan 5, 2021·0 cites·20 claims
- 1227US6823294B1Method and system for measuring circuit design capabilityCOLLETT INTERNATIONAL INC·Filed 1999·Granted Nov 23, 2004·10 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →