Inventor · disambiguated record
Douglas P. Nadeau
Also filed as: NADEAU DOUGLAS P · NADEAU DOUGLAS PAUL
13 granted patents·3 pending applications·492 citations·filing 1996–2008
94Inventor score
Files withIBM14
Top patents by PatentIndex Score
16 records- 0191US5913713ACMP polishing pad backside modifications for advantageous polishing resultsIBM·Filed 1997·Granted Jun 22, 1999·95 cites·27 claims
- 0288US5704987AProcess for removing residue from a semiconductor wafer after chemical-mechanical polishingIBM·Filed 1996·Granted Jan 6, 1998·104 cites·9 claims
- 0387US5778481ASilicon wafer cleaning and polishing padsIBM·Filed 1996·Granted Jul 14, 1998·102 cites·6 claims
- 0485US7480888B1Design structure for facilitating engineering changes in integrated circuitsIBM·Filed 2008·Granted Jan 20, 2009·14 cites·3 claims
- 0580US6432823B1Off-concentric polishing system designIBM·Filed 1999·Granted Aug 13, 2002·42 cites·5 claims
- 0675US6300246B1Method for chemical mechanical polishing of semiconductor waferIBM·Filed 2000·Granted Oct 9, 2001·18 cites·14 claims
- 0771US6647579B2Brush pressure control system for chemical and mechanical treatment of semiconductor surfacesIBM·Filed 2000·Granted Nov 18, 2003·15 cites·5 claims
- 0867US6273797B1In-situ automated CMP wedge conditionerIBM·Filed 1999·Granted Aug 14, 2001·28 cites·13 claims
- 0960US6287178B1Wafer carrier rinsing mechanismIBM·Filed 1999·Granted Sep 11, 2001·22 cites·10 claims
- 1054US5834642ADownstream monitor for CMP brush cleanersIBM·Filed 1997·Granted Nov 10, 1998·17 cites·7 claims
- 1152US5894622ABrush conditioner wingIBM·Filed 1997·Granted Apr 20, 1999·20 cites·7 claims
- 1249US5974868ADownstream monitor for CMP brush cleanersIBM·Filed 1998·Granted Nov 2, 1999·13 cites·11 claims
- 1340US2005244047A1Stop motion imaging detection system and methodIBM·Filed 2004·Application pending·0 cites
- 1439US2002182866A1Off-concentric polishing system designFiled 2002·Application pending·0 cites
- 1536US2001023166A1Wafer carrier rinsing mechanismFiled 2001·Application pending·0 cites
- 1628US6247368B1CMP wet application wafer sensorIBM·Filed 1999·Granted Jun 19, 2001·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →