Inventor · disambiguated record
Jochen Von Hagen
Also filed as: VON HAGEN JOCHEN
3 granted patents·1 pending application·25 citations·filing 2002–2010
68Inventor score
Top patents by PatentIndex Score
4 records- 0174US6787799B2Device and method for detecting a reliability of integrated semiconductor components at high temperaturesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·19 cites·9 claims
- 0272US8323991B2Method for detecting stress migration propertiesFISCHER ARMIN·Filed 2010·Granted Dec 4, 2012·3 cites·7 claims
- 0368US7888672B2Device for detecting stress migration propertiesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 15, 2011·3 cites·18 claims
- 0427US2006125494A1Electromigration test device and electromigration test methodVON HAGEN JOCHEN·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →