Inventor · disambiguated record
Luai Nasser
Also filed as: NASSER LUAI
3 granted patents·6 citations·filing 2004–2012
59Inventor score
Top patents by PatentIndex Score
3 records- 0176US7542134B2System, method and apparatus for in-situ substrate inspectionLAM RES CORP·Filed 2008·Granted Jun 2, 2009·4 cites·9 claims
- 0256US7397555B2System, method and apparatus for in-situ substrate inspectionLAM RES CORP·Filed 2004·Granted Jul 8, 2008·1 cites·10 claims
- 0355US9007079B2System and method for compensating measured IDDQ valuesNVIDIA CORP·Filed 2012·Granted Apr 14, 2015·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →