Inventor · disambiguated record
Eui-Youl Ryu
Also filed as: RYU EUI-YOUL
14 granted patents·1 pending application·202 citations·filing 2001–2013
91Inventor score
Files withSAMSUNG ELECTRONICS CO LTD15
Top patents by PatentIndex Score
15 records- 0194US6803276B2Semiconductor device having a flash memory cell and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 12, 2004·79 cites·24 claims
- 0288US6784476B2Semiconductor device having a flash memory cell and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Aug 31, 2004·42 cites·15 claims
- 0378US6524915B2Split-gate flash memory and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 25, 2003·25 cites·19 claims
- 0475US6649471B2Method of planarizing non-volatile memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 18, 2003·20 cites·40 claims
- 0573US9696771B2Methods and systems for operating multi-core processorsSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 4, 2017·4 cites·8 claims
- 0665US6724661B2Erasing method in non-volatile memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Apr 20, 2004·14 cites·14 claims
- 0763US6800525B2Method of manufacturing split gate flash memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 5, 2004·10 cites·13 claims
- 0854US6683340B2Split gate flash memorySAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 27, 2004·5 cites·14 claims
- 0948US9043629B2Multi-cluster processing system and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted May 26, 2015·0 cites·18 claims
- 1048US7195933B2Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring patternSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 27, 2007·0 cites·22 claims
- 1147US7564092B2Flash memory device having a split gateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 21, 2009·0 cites·10 claims
- 1246US6977200B2Method of manufacturing split-gate memorySAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Dec 20, 2005·3 cites·20 claims
- 1343US7094646B2Flash memory device having a split gate and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Aug 22, 2006·0 cites·22 claims
- 1443US6924505B2Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring patternSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 2, 2005·0 cites·18 claims
- 1537US2006001077A1Split gate type flash memory device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →