Inventor · disambiguated record
Han Cheng Ge
Also filed as: GE HAN CHENG
6 granted patents·13 citations·filing 2007–2018
76Inventor score
Files withAMANULLAH AJHARALI2ASTI HOLDINGS LTD2Generic Power Ptd Ltd1SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD1
Top patents by PatentIndex Score
6 records- 0184US10876975B2System and method for inspecting a waferSEMICONDUCTOR TECH & INSTRUMENTS PTE LTD·Filed 2018·Granted Dec 29, 2020·4 cites·14 claims
- 0273US9863889B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Jan 9, 2018·4 cites·25 claims
- 0362US7869021B2Multiple surface inspection system and methodASTI HOLDINGS LTD·Filed 2008·Granted Jan 11, 2011·2 cites·23 claims
- 0459US10161881B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Dec 25, 2018·1 cites·28 claims
- 0557US7768633B2Multiple surface inspection system and methodASTI HOLDINGS LTD·Filed 2007·Granted Aug 3, 2010·1 cites·20 claims
- 0649US10151580B2Methods of inspecting a 3D object using 2D image processingGeneric Power Ptd Ltd·Filed 2015·Granted Dec 11, 2018·1 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Han Cheng Ge files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →