Inventor · disambiguated record
Yasuhide Kuramochi
Also filed as: KURAMOCHI YASUHIDE
23 granted patents·3 pending applications·136 citations·filing 2005–2015
94Inventor score
Top patents by PatentIndex Score
26 records- 0193US7978109B1Output apparatus and test apparatusADVANTEST CORP·Filed 2010·Granted Jul 12, 2011·20 cites·14 claims
- 0292US7605738B2A-D converter and A-D convert methodADVANTEST CORP·Filed 2007·Granted Oct 20, 2009·28 cites·11 claims
- 0389US8193960B2Output apparatus and test apparatusKURAMOCHI YASUHIDE·Filed 2010·Granted Jun 5, 2012·15 cites·16 claims
- 0483US7609184B2D-A convert apparatus and A-D convert apparatusADVANTEST CORP·Filed 2007·Granted Oct 27, 2009·15 cites·13 claims
- 0581US7755521B1A-D convert apparatus, D-A convert apparatus and adjustment methodADVANTEST CORP·Filed 2008·Granted Jul 13, 2010·12 cites·11 claims
- 0680US9869702B2Current measurement circuitADVANTEST CORP·Filed 2015·Granted Jan 16, 2018·4 cites·9 claims
- 0779US7477177B2A-D converter, A-D convert method, and A-D convert programADVANTEST CORP·Filed 2006·Granted Jan 13, 2009·10 cites·12 claims
- 0870US7479914B2A-D converter and A-D convert methodADVANTEST CORP·Filed 2007·Granted Jan 20, 2009·6 cites·8 claims
- 0963US7778319B2Jitter measuring apparatus, jitter measuring method and test apparatusADVANTEST CORP·Filed 2005·Granted Aug 17, 2010·4 cites·13 claims
- 1062US8059021B2Digital-analog converting apparatus and test apparatusKURAMOCHI YASUHIDE·Filed 2009·Granted Nov 15, 2011·4 cites·8 claims
- 1159US8068047B2A-D convert apparatus and control methodKURAMOCHI YASUHIDE·Filed 2010·Granted Nov 29, 2011·3 cites·12 claims
- 1259US7583218B2Comparator and A-D converterADVANTEST CORP·Filed 2007·Granted Sep 1, 2009·3 cites·5 claims
- 1355US8179154B2Device, test apparatus and test methodKURAMOCHI YASUHIDE·Filed 2008·Granted May 15, 2012·2 cites·21 claims
- 1455US8068538B2Jitter measuring apparatus, jitter measuring method and test apparatusICHIYAMA KIYOTAKA·Filed 2005·Granted Nov 29, 2011·2 cites·9 claims
- 1552US7696918B2A-D convert apparatusTOKYO INST TECH·Filed 2008·Granted Apr 13, 2010·2 cites·9 claims
- 1651US8081096B2Signal generating apparatus and test apparatusKURAMOCHI YASUHIDE·Filed 2009·Granted Dec 20, 2011·2 cites·20 claims
- 1751US7705763B2A-D convert apparatusTOKYO INST TECH·Filed 2008·Granted Apr 27, 2010·2 cites·11 claims
- 1848US7982520B2Signal generating apparatus and test apparatusADVANTEST CORP·Filed 2009·Granted Jul 19, 2011·2 cites·18 claims
- 1945US8941521B2Analog to digital converter and digital to analog converterADVANTEST CORP·Filed 2013·Granted Jan 27, 2015·0 cites·11 claims
- 2043US10228362B2Measurement apparatusADVANTEST CORP·Filed 2015·Granted Mar 12, 2019·0 cites·18 claims
- 2142US2014028326A1Da-converter and test apparatusADVANTEST CORP·Filed 2013·Application pending·0 cites
- 2241US8378873B2Analog to digital converter and digital to analog converterADVANTEST CORP·Filed 2011·Granted Feb 19, 2013·0 cites·17 claims
- 2338US10436822B2Measurement apparatusADVANTEST CORP·Filed 2015·Granted Oct 8, 2019·0 cites·16 claims
- 2436US8094053B2Signal generating apparatus and test apparatusKURAMOCHI YASUHIDE·Filed 2009·Granted Jan 10, 2012·0 cites·20 claims
- 2536US2012176143A1Sampling apparatus and test apparatusKAWABATA MASAYUKI·Filed 2011·Application pending·0 cites
- 2633US2011181298A1Measurement apparatus and test apparatusADVANTEST CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →