Inventor · disambiguated record
Alan Somerville
Also filed as: SOMERVILLE ALAN · SOMERVILLE ALAN MURRAY
10 granted patents·3 pending applications·92 citations·filing 2004–2019
88Inventor score
Files withDIALOG SEMICONDUCTOR GMBH6DIALOG SEMICONDUCTOR UK LTD3SOMERVILLE ALAN3VON STAUDT HANS MARTIN1
Top patents by PatentIndex Score
13 records- 0192US8610650B2Advanced multi line addressingSOMERVILLE ALAN·Filed 2009·Granted Dec 17, 2013·22 cites·34 claims
- 0289US7514989B1Dynamic matching of current sourcesDIALOG SEMICONDUCTOR GMBH·Filed 2007·Granted Apr 7, 2009·34 cites·30 claims
- 0381US10348112B2Power management circuitDIALOG SEMICONDUCTOR UK LTD·Filed 2016·Granted Jul 9, 2019·4 cites·24 claims
- 0481US8395565B2Tagged multi line address drivingSOMERVILLE ALAN·Filed 2009·Granted Mar 12, 2013·6 cites·27 claims
- 0580US8957696B2Driver chip based OLED module connectivity testVON STAUDT HANS MARTIN·Filed 2010·Granted Feb 17, 2015·5 cites·25 claims
- 0670US9280930B2Back to back pre-charge schemeSOMERVILLE ALAN·Filed 2009·Granted Mar 8, 2016·3 cites·38 claims
- 0762US10727749B1Dual rail power supply systemDIALOG SEMICONDUCTOR UK LTD·Filed 2019·Granted Jul 28, 2020·1 cites·22 claims
- 0854US2010295861A1Extended multi line address drivingDIALOG SEMICONDUCTOR GMBH·Filed 2009·Application pending·0 cites
- 0950US7142041B2Controlled active shutdown of charge pumpDIALOG SEMICONDUCTOR GMBH·Filed 2004·Granted Nov 28, 2006·9 cites·22 claims
- 1048US7170271B2Use of charge pump active dischargeDIALOG SEMICONDUCTOR GMBH·Filed 2004·Granted Jan 30, 2007·8 cites·21 claims
- 1140US7960982B2Supply current based testing of CMOS output stagesDIALOG SEMICONDUCTOR GMBH·Filed 2008·Granted Jun 14, 2011·0 cites·15 claims
- 1240US2011227815A1PWM precharge of organic light emitting diodesDIALOG SEMICONDUCTOR GMBH·Filed 2010·Application pending·0 cites
- 1336US2017187200A1Charger Communication by Load ModulationDIALOG SEMICONDUCTOR UK LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →