Inventor · disambiguated record
Jaehyung Ahn
Also filed as: AHN JAEHYUNG
9 granted patents·4 pending applications·0 citations·filing 2017–2024
73Inventor score
Top patents by PatentIndex Score
13 records- 0168US12086599B2Accelerator, method of operating the accelerator, and device including the acceleratorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 10, 2024·0 cites·17 claims
- 0257US2021191728A1Accelerator, method of operating the accelerator, and device including the acceleratorSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 0355US2024332093A1Critical dimension prediction system and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0455US2025238665A1Electronic device for fine-tuning a machine learning model and method of operating the electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0554US12056004B2Method and apparatus with cosmic ray fault protectionSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 6, 2024·0 cites·25 claims
- 0654US12019520B2Electronic device and method with on-demand accelerator checkpointingSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 25, 2024·0 cites·27 claims
- 0753US12014215B2Active scheduling method and computing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 18, 2024·0 cites·22 claims
- 0853US2024248051A1Wafer measurement apparatus and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0952US12362138B2Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 1051US12493777B2Data processing method and apparatus for excuting neural network on acceleratorSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 9, 2025·0 cites·20 claims
- 1147US12014202B2Method and apparatus with acceleratorSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 18, 2024·0 cites·21 claims
- 1243US10664418B2Peripheral device controlling device, operation method thereof, and operation method of peripheral device controlling device driverSEOUL NAT UNIV R&DB FOUNDATION·Filed 2018·Granted May 26, 2020·0 cites·19 claims
- 1340US10269111B2Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 23, 2019·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →