Inventor · disambiguated record
Weerakiat Wahawisan
Also filed as: WAHAWISAN WEERAKIAT
5 granted patents·1 pending application·211 citations·filing 1994–2002
84Inventor score
Files withSEMICONDUCTOR TECH & INSTR INC5
Top patents by PatentIndex Score
6 records- 0192US6118540AMethod and apparatus for inspecting a workpieceSEMICONDUCTOR TECH & INSTR INC·Filed 1997·Granted Sep 12, 2000·99 cites·17 claims
- 0281US5956134AInspection system and method for leads of semiconductor devicesSEMICONDUCTOR TECH & INSTR INC·Filed 1998·Granted Sep 21, 1999·68 cites·30 claims
- 0372US6765666B1System and method for inspecting bumped wafersSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Jul 20, 2004·18 cites·18 claims
- 0446US5745593AMethod and system for inspecting integrated circuit lead burrsSEMICONDUCTOR TECH & INSTR INC·Filed 1996·Granted Apr 28, 1998·16 cites·22 claims
- 0538US5777886AProgrammable lead conditionerSEMICONDUCTOR TECH & INSTR INC·Filed 1994·Granted Jul 7, 1998·10 cites·22 claims
- 0632US2004086198A1System and method for bump height measurementFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →