Inventor · disambiguated record
John Christopher Shriner
Also filed as: SHRINER JOHN · SHRINER JOHN CHRISTOPHER
7 granted patents·9 pending applications·25 citations·filing 2003–2025
79Inventor score
Top patents by PatentIndex Score
16 records- 0185US11984362B1Control of locos structure thickness without a maskTEXAS INSTRUMENTS INC·Filed 2021·Granted May 14, 2024·1 cites·20 claims
- 0284US2025351544A1Control of locos structure thickness without a maskTEXAS INSTRUMENTS INC·Filed 2025·Application pending·0 cites
- 0381US12376370B2Control of locos structure thickness without a maskTEXAS INSTRUMENTS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 0481US7844559B2Method and system for predicting process performance using material processing tool and sensor dataTOKYO ELECTRON LTD·Filed 2008·Granted Nov 30, 2010·7 cites·19 claims
- 0574US6825920B2Method and system of determining chamber seasoning condition by optical emissionTOKYO ELECTRON LTD·Filed 2003·Granted Nov 30, 2004·15 cites·41 claims
- 0656US10541183B2Spectral reflectometry window heaterSHRINER JOHN CHRISTOPHER·Filed 2012·Granted Jan 21, 2020·2 cites·20 claims
- 0754US2024290785A1Reducing Defects In a Polysilicon Overlaid Fin StructureTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 0852US2018068908A1Smart in situ chamber cleanTEXAS INSTRUMENTS INC·Filed 2017·Application pending·0 cites
- 0950US10923406B2Spectral reflectometry window heaterTEXAS INSTRUMENTS INC·Filed 2019·Granted Feb 16, 2021·0 cites·20 claims
- 1049US2023135889A1Integrated circuit device with improved oxide edgingTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 1148US2017133284A1Smart in-situ chamber cleanTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
- 1245US9224592B2Method of etching ferroelectric capacitor stackTEXAS INSTRUMENTS INC·Filed 2014·Granted Dec 29, 2015·0 cites·12 claims
- 1341US2015024517A1Plasma etcher chuck bandTEXAS INSTRUMENTS INC·Filed 2014·Application pending·0 cites
- 1440US2005252884A1Method and system for predicting process performance using material processing tool and sensor dataTOKYO ELECTRON LTD·Filed 2003·Application pending·0 cites
- 1534US2011079580A1Lower chamber heaters for improved etch processesTEXAS INSTRUMENTS INC·Filed 2010·Application pending·0 cites
- 1630US2013149866A1Baffle plate for semiconductor processing apparatusSHRINER JOHN CHRISTOPHER·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →