Inventor · disambiguated record
Yanjia Sun
Also filed as: SUN YANJIA
5 granted patents·86 citations·filing 2015–2017
80Inventor score
Files withFUTUREWEI TECHNOLOGIES INC5
Top patents by PatentIndex Score
5 records- 0195US9961571B2System and method for a multi view learning approach to anomaly detection and root cause analysisFUTUREWEI TECHNOLOGIES INC·Filed 2015·Granted May 1, 2018·49 cites·23 claims
- 0293US10397810B2Fingerprinting root cause analysis in cellular systemsFUTUREWEI TECHNOLOGIES INC·Filed 2016·Granted Aug 27, 2019·22 cites·17 claims
- 0386US10332056B2Features selection and pattern mining for KQI prediction and cause analysisFUTUREWEI TECHNOLOGIES INC·Filed 2016·Granted Jun 25, 2019·6 cites·27 claims
- 0485US10489363B2Distributed FP-growth with node table for large-scale association rule miningFUTUREWEI TECHNOLOGIES INC·Filed 2016·Granted Nov 26, 2019·8 cites·25 claims
- 0563US10482158B2User-level KQI anomaly detection using markov chain modelFUTUREWEI TECHNOLOGIES INC·Filed 2017·Granted Nov 19, 2019·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →