Inventor · disambiguated record
Lynn Cai
Also filed as: CAI LYNN
7 granted patents·263 citations·filing 2001–2009
89Inventor score
Top patents by PatentIndex Score
7 records- 0197US6873720B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2001·Granted Mar 29, 2005·112 cites·54 claims
- 0295US7835565B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2009·Granted Nov 16, 2010·17 cites·32 claims
- 0395US7254251B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2005·Granted Aug 7, 2007·30 cites·8 claims
- 0494US7403649B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2007·Granted Jul 22, 2008·20 cites·19 claims
- 0593US7565001B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2008·Granted Jul 21, 2009·14 cites·32 claims
- 0692US6925202B2System and method of providing mask quality controlSYNOPSYS INC·Filed 2001·Granted Aug 2, 2005·55 cites·41 claims
- 0768US6870951B2Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysisNUMERICAL TECH INC·Filed 2002·Granted Mar 22, 2005·15 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →