Inventor · disambiguated record
Edward V. Bautista, Jr.
Also filed as: BAUTISTA EDWARD V · BAUTISTA JR EDWARD V
22 granted patents·1 pending application·720 citations·filing 2000–2008
96Inventor score
Top patents by PatentIndex Score
23 records- 0195US6631086B1On-chip repair of defective address of core flash memory cellsADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 7, 2003·111 cites·20 claims
- 0294US7010736B1Address sequencer within BIST (Built-in-Self-Test) systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 7, 2006·106 cites·28 claims
- 0393US8117521B2Implementation of recycling unused ECC parity bits during flash memory programmingPARKER ALLAN·Filed 2008·Granted Feb 14, 2012·178 cites·20 claims
- 0491US6331951B1Method and system for embedded chip erase verificationADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 18, 2001·67 cites·23 claims
- 0589US6665214B1On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) modeADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 16, 2003·58 cites·18 claims
- 0683US7028240B1Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machineADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 11, 2006·34 cites·24 claims
- 0777US6269026B1Charge sharing to help boost the wordlines during APDE verifyADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 31, 2001·25 cites·20 claims
- 0873US6622274B1Method of micro-architectural implementation on bist fronted state machine utilizing ‘death logic’ state transition for area minimizationADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 16, 2003·21 cites·2 claims
- 0966US6891752B1System and method for erase voltage control during multiple sector erase of a flash memory deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted May 10, 2005·15 cites·20 claims
- 1066US6532175B1Method and apparatus for soft program verification in a memory deviceADVANCED MICRO DEVICES IN·Filed 2002·Granted Mar 11, 2003·16 cites·25 claims
- 1165US6587982B1Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cyclingADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 1, 2003·12 cites·6 claims
- 1264US6385093B1I/O partitioning system and methodology to reduce band-to-band tunneling current during eraseADVANCED MICRO DEVICES INC·Filed 2001·Granted May 7, 2002·13 cites·33 claims
- 1364US6324108B1Application of external voltage during array VT testingADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 27, 2001·13 cites·24 claims
- 1459US6459628B1System and method to facilitate stabilization of reference voltage signals in memory devicesADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 1, 2002·9 cites·24 claims
- 1558US7057949B1Method and apparatus for pre-charging negative pump MOS regulation capacitorsADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 6, 2006·10 cites·16 claims
- 1653US6973003B1Memory device and methodADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 6, 2005·8 cites·24 claims
- 1750US6980473B1Memory device and methodADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 27, 2005·6 cites·14 claims
- 1850US6285594B1Wordline voltage protectionADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 4, 2001·6 cites·26 claims
- 1946US6970368B1CAM (content addressable memory) cells as part of core array in flash memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 29, 2005·4 cites·35 claims
- 2046US6549477B1System and method to facilitate stabilization of reference voltage signals in memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 15, 2003·4 cites·7 claims
- 2145US6212098B1Voltage protection of write protect camsADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 3, 2001·4 cites·22 claims
- 2237US6771093B1Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductorADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 3, 2004·0 cites·21 claims
- 2330US2004049724A1Built-in-self-test (BIST) of flash memory cells and implementation of BIST interfaceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →