Inventor · disambiguated record
Kazutoyo Takano
Also filed as: TAKANO KAZUTOYO
12 granted patents·2 pending applications·22 citations·filing 2001–2024
86Inventor score
Top patents by PatentIndex Score
14 records- 0186US11251177B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Feb 15, 2022·2 cites·6 claims
- 0273US8377832B2Method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2009·Granted Feb 19, 2013·5 cites·12 claims
- 0372US7955930B2Semiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2010·Granted Jun 7, 2011·3 cites·5 claims
- 0469US12476153B2Semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2022·Granted Nov 18, 2025·0 cites·10 claims
- 0567US7701003B2Semiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2007·Granted Apr 20, 2010·3 cites·4 claims
- 0665US8278706B2Semiconductor device and method of manufacturing the sameTAKANO KAZUTOYO·Filed 2010·Granted Oct 2, 2012·3 cites·7 claims
- 0764US9093310B2Semiconductor device having a variation lateral doping structure and method for manufaturing the sameTAKANO KAZUTOYO·Filed 2012·Granted Jul 28, 2015·2 cites·5 claims
- 0861US11527449B2Semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Dec 13, 2022·0 cites·5 claims
- 0960US2025166996A1Semiconductor device and method for manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1056US11531053B2Semiconductor device and crack detection methodMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Dec 20, 2022·0 cites·6 claims
- 1147US9406571B2Method for manufacturing semiconductor device including inline inspectionMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Aug 2, 2016·0 cites·5 claims
- 1247US6388280B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted May 14, 2002·4 cites·12 claims
- 1335US10665670B2Semiconductor device and method for manufacturing sameMITSUBISHI ELECTRIC CORP·Filed 2016·Granted May 26, 2020·0 cites·20 claims
- 1432US2017062412A1Transistor element and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →