Inventor · disambiguated record
Jeffrey Andresen
Also filed as: ANDRESEN JEFFREY
8 granted patents·10 citations·filing 2019–2023
80Inventor score
Files withNANOTRONICS IMAGING INC8
Top patents by PatentIndex Score
8 records- 0194US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 0285US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 0376US11656184B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·0 cites·20 claims
- 0474US11995802B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 0570US11663703B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 0670US11341617B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2021·Granted May 24, 2022·0 cites·20 claims
- 0765US11408829B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 0862US10914686B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2020·Granted Feb 9, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →