Inventor · disambiguated record
Masayuki Tsukuda
Also filed as: TSUKUDA MASAYUKI
5 granted patents·19 citations·filing 2007–2020
72Inventor score
Top patents by PatentIndex Score
5 records- 0180US7683627B2Semiconductor device having a function of detection breakages on a periphery thereofNEC ELECTRONICS CORP·Filed 2007·Granted Mar 23, 2010·14 cites·10 claims
- 0273US8713508B2Semiconductor device, semiconductor device design method, semiconductor design apparatus, and programTOMODA MASAFUMI·Filed 2012·Granted Apr 29, 2014·5 cites·21 claims
- 0355US11675005B2Semiconductor device and scan test method of the sameRENESAS ELECTRONICS CORP·Filed 2020·Granted Jun 13, 2023·0 cites·15 claims
- 0449US9054120B2Semiconductor device, semiconductor device design method, semiconductor device design apparatus, and programRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 9, 2015·0 cites·14 claims
- 0546US9589893B2Semiconductor device, semiconductor device design method, semiconductor device design apparatus, and programRENESAS ELECTRONICS CORP·Filed 2015·Granted Mar 7, 2017·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →