Inventor · disambiguated record
Fumiyuki Takahashi
Also filed as: TAKAHASHI FUMIYUKI
9 granted patents·2 pending applications·126 citations·filing 1986–2020
87Inventor score
Top patents by PatentIndex Score
11 records- 0181US6555836B1Method and apparatus for inspecting bumps and determining height from a regular reflection regionFUJITSU LTD·Filed 2000·Granted Apr 29, 2003·22 cites·12 claims
- 0278US5999266AMethod for inspecting height, and a height inspection apparatus to carry out the methodFUJITSU LTD·Filed 1997·Granted Dec 7, 1999·48 cites·19 claims
- 0370US7443516B2Optical-distortion correcting apparatus and optical-distortion correcting methodFUJITSU LTD·Filed 2005·Granted Oct 28, 2008·7 cites·9 claims
- 0467US6052189AHeight measurement device and height measurement methodFUJITSU LTD·Filed 1997·Granted Apr 18, 2000·32 cites·13 claims
- 0561US7593596B2Phase unwrapping method, program, and interference measurement apparatusFUJITSU LTD·Filed 2006·Granted Sep 22, 2009·4 cites·19 claims
- 0650US10133256B2Information processing apparatus and method for calculating inspection rangesFUJITSU LTD·Filed 2015·Granted Nov 20, 2018·0 cites·15 claims
- 0745US11010634B2Measurement apparatus, measurement method, and computer-readable recording medium storing measurement programFUJITSU LTD·Filed 2019·Granted May 18, 2021·0 cites·20 claims
- 0842US6104493AMethod and apparatus for visual inspection of bump arrayFUJITSU LTD·Filed 1999·Granted Aug 15, 2000·9 cites·25 claims
- 0940US2018286069A1Image processing apparatus and image processing methodFUJITSU LTD·Filed 2018·Application pending·0 cites
- 1040US2020250845A1Evaluation method and information processing apparatusFUJITSU LTD·Filed 2020·Application pending·0 cites
- 1132US4676580AAdaptable terminal assembly for multi-contact electrical connectorDU PONT·Filed 1986·Granted Jun 30, 1987·4 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →