Inventor · disambiguated record

Shinichi Tamabayashi

Also filed as: TAMABAYASHI SHINICHI

1 granted patent·0 citations·filing 2002–2002

4Inventor score

Technology areasG01M

Files withNEC TOPPAN CIRCUIT SOLUTIONS1

Top patents by PatentIndex Score

1 record

0133US7106426B2Method of inspecting optical waveguide substrate for optical conduction at increased speed and also inspecting optical waveguide substrate for crosstalkNEC TOPPAN CIRCUIT SOLUTIONS·Filed 2002·Granted Sep 12, 2006·0 cites·4 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →