Inventor · disambiguated record
Jang-Hyuk An
Also filed as: AN JANG-HYUK
4 granted patents·15 citations·filing 2009–2018
70Inventor score
Top patents by PatentIndex Score
4 records- 0177US10067813B2Method of analyzing a fault of an electronic systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Sep 4, 2018·3 cites·19 claims
- 0276US8266572B2Method for acquiring overshoot voltage and analyzing degradation of a gate insulation using the sameKIM SUNG-SOO·Filed 2009·Granted Sep 11, 2012·7 cites·6 claims
- 0372US8680883B2Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the sameCHO YONG-SANG·Filed 2011·Granted Mar 25, 2014·4 cites·16 claims
- 0466US10789112B2Device lifespan estimation method, device design method, and computer readable storage mediumSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 29, 2020·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →