Inventor · disambiguated record
David W. Koppenaal
Also filed as: KOPPENAAL DAVID W
8 granted patents·2 pending applications·196 citations·filing 1996–2019
88Inventor score
Top patents by PatentIndex Score
10 records- 0193US8648295B2Combined distance-of-flight and time-of-flight mass spectrometerENKE CHRISTIE G·Filed 2011·Granted Feb 11, 2014·27 cites·30 claims
- 0292US8604423B2Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometryENKE CHRISTIE G·Filed 2011·Granted Dec 10, 2013·36 cites·14 claims
- 0388US6259091B1Apparatus for reduction of selected ion intensities in confined ion beamsBATTELLE MEMORIAL INSTITUTE·Filed 1998·Granted Jul 10, 2001·63 cites·22 claims
- 0486US10269525B2Means of introducing an analyte into liquid sampling atmospheric pressure glow dischargeUNIV CLEMSON·Filed 2016·Granted Apr 23, 2019·4 cites·11 claims
- 0585US9536725B2Means of introducing an analyte into liquid sampling atmospheric pressure glow dischargeUNIV CLEMSON·Filed 2014·Granted Jan 3, 2017·7 cites·18 claims
- 0685US7498585B2Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of sameBATTELLE MEMORIAL INSTITUTE·Filed 2006·Granted Mar 3, 2009·8 cites·29 claims
- 0785US5767512AMethod for reduction of selected ion intensities in confined ion beamsBATTELLE MEMORIAL INSTITUTE·Filed 1996·Granted Jun 16, 1998·51 cites·14 claims
- 0857US2009121151A1Method and Apparatus for Simultaneous Detection and Measurement of Charged Particles at One or More Levels of Particle Flux for Analysis of SameDENTON M BONNER·Filed 2009·Application pending·0 cites
- 0955US11366066B2Multi-electrode/multi-modal atmospheric pressure glow discharge plasma ionization deviceBATTELLE MEMORIAL INSTITUTE·Filed 2019·Granted Jun 21, 2022·0 cites·13 claims
- 1036US2014138538A1Resolution and mass range performance in distance-of-flight mass spectrometry with a multichannel focal-plane camera detectorHIEFTJE GARY M·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →