Inventor · disambiguated record
Hitoshi Chiyoma
Also filed as: CHIYOMA HITOSHI
12 granted patents·1 pending application·342 citations·filing 1985–2017
91Inventor score
Top patents by PatentIndex Score
13 records- 0196US6262513B1Electronic component and method of production thereofTOSHIBA KK·Filed 1996·Granted Jul 17, 2001·163 cites·9 claims
- 0291US6754950B2Electronic component and method of production thereofTOSHIBA KK·Filed 2001·Granted Jun 29, 2004·45 cites·7 claims
- 0391US6628043B2Electronic component and method of production thereofTOSHIBA KK·Filed 2001·Granted Sep 30, 2003·30 cites·6 claims
- 0488US7982190B2Radiation detector and method for producing the sameTOSHIBA ELECTRON TUBES & DEVIC·Filed 2010·Granted Jul 19, 2011·10 cites·16 claims
- 0583US10007004B2Apparatus and method of manufacturing radiation detection panelTOSHIBA ELECTRON TUBES & DEVIC·Filed 2017·Granted Jun 26, 2018·1 cites·6 claims
- 0683US9880292B2Apparatus and method of manufacturing radiation detection panelTOSHIBA ELECTRON TUBES & DEVIC·Filed 2014·Granted Jan 30, 2018·2 cites·7 claims
- 0781US6377138B1Surface acoustic wave device with a layered conductive film and method of producing the sameTOSHIBA KK·Filed 1998·Granted Apr 23, 2002·71 cites·12 claims
- 0871US9964652B2Apparatus and method of manufacturing radiation detection panelTOSHIBA ELECTRON TUBES & DEVIC·Filed 2017·Granted May 8, 2018·1 cites·10 claims
- 0969US7772562B2Radiation detectorTOSHIBA KK·Filed 2009·Granted Aug 10, 2010·2 cites·8 claims
- 1065US7755053B2Radiation detection apparatusTOSHIBA KK·Filed 2008·Granted Jul 13, 2010·4 cites·4 claims
- 1148US2008237474A1Semiconductor photodiode and method for manufacturing same, radiation detection device, and radiation imaging apparatusTOSHIBA KK·Filed 2008·Application pending·0 cites
- 1243US4679088AImage sensor with means to adjust capacitance of signal leadsTOSHIBA KK·Filed 1985·Granted Jul 7, 1987·13 cites·16 claims
- 1332US9006669B2Radiation detectorCHIYOMA HITOSHI·Filed 2010·Granted Apr 14, 2015·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →