Inventor · disambiguated record
Charles Lin
Also filed as: LIN CHARLES · LIN CHARLES G · LIN CHARLES GUO
19 granted patents·2 pending applications·311 citations·filing 1997–2024
95Inventor score
Files withCHARTERED SEMICONDUCTOR MFG14SKYWORKS SOLUTIONS INC4LIN CHARLES GUO1SILICON LAB INC1TEXAS INSTRUMENTS INC1
Top patents by PatentIndex Score
21 records- 0197US11575305B2Interface for passing control information over an isolation channelSKYWORKS SOLUTIONS INC·Filed 2020·Granted Feb 7, 2023·8 cites·21 claims
- 0296US11962233B2Interface for passing control information over an isolation channelSKYWORKS SOLUTIONS INC·Filed 2023·Granted Apr 16, 2024·3 cites·19 claims
- 0391US12218576B2Interface for passing control information over an isolation channelSKYWORKS SOLUTIONS INC·Filed 2024·Granted Feb 4, 2025·1 cites·14 claims
- 0482US6211040B1Two-step, low argon, HDP CVD oxide deposition processCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Apr 3, 2001·80 cites·20 claims
- 0580US6245193B1Chemical mechanical polishing apparatus improved substrate carrier head and method of useCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 12, 2001·24 cites·10 claims
- 0680US2025233505A1Interface for passing control information over an isolation channelSKYWORKS SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 0778US8552797B2High accuracy RC calibradion circuitLIN CHARLES GUO·Filed 2011·Granted Oct 8, 2013·7 cites·19 claims
- 0872US6207554B1Gap filling process in integrated circuits using low dielectric constant materialsCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Mar 27, 2001·39 cites·22 claims
- 0971US6653227B1Method of cobalt silicidation using an oxide-Titanium interlayerCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Nov 25, 2003·21 cites·21 claims
- 1065US6183189B1Self aligning wafer chuck design for wafer processing toolsCHARTERED SEMICONDUCTOR MFG·Filed 1998·Granted Feb 6, 2001·35 cites·21 claims
- 1162US8023919B2Receiver dynamically switching to pseudo differential mode for SOC spur reductionTEXAS INSTRUMENTS INC·Filed 2008·Granted Sep 20, 2011·3 cites·20 claims
- 1260US6376378B1Polishing apparatus and method for forming an integrated circuitCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Apr 23, 2002·21 cites·28 claims
- 1357US7156726B1Polishing apparatus and method for forming an integrated circuitCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Jan 2, 2007·6 cites·6 claims
- 1454US6964598B1Polishing apparatus and method for forming an integrated circuitCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Nov 15, 2005·4 cites·7 claims
- 1554US6136710AChemical mechanical polishing apparatus with improved substrate carrier head and method of useCHARTERED SEMICONDUCTOR MFG·Filed 1998·Granted Oct 24, 2000·18 cites·14 claims
- 1649US10699995B2Isolator with symmetric multi-channel layoutSILICON LAB INC·Filed 2018·Granted Jun 30, 2020·0 cites·20 claims
- 1745US5918152AGap filling method using high pressureCHARTERED SEMICONDUCTOR MFG·Filed 1997·Granted Jun 29, 1999·13 cites·16 claims
- 1842US6558739B1Titanium nitride/titanium tungsten alloy composite barrier layer for integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 1997·Granted May 6, 2003·11 cites·12 claims
- 1941US6443809B1Polishing apparatus and method for forming an integrated circuitCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Sep 3, 2002·8 cites·20 claims
- 2039US6054390AGrazing incident angle processing method for microelectronics layer fabricationCHARTERED SEMICONDUCTOR MFG·Filed 1997·Granted Apr 25, 2000·9 cites·11 claims
- 2138US2001012687A1Gap filling process in integrated circuits using low dielectric constant materialsCHARTERED SEMICONDUCTOR MFG·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →