Inventor · disambiguated record
Georg Flatscher
Also filed as: FLATSCHER GEORG
9 granted patents·1 pending application·150 citations·filing 1981–2003
89Inventor score
Top patents by PatentIndex Score
10 records- 0177US4632059AEvaporator device for the evaporation of several materialsHEIDENHAIN GMBH DR JOHANNES·Filed 1985·Granted Dec 30, 1986·28 cites·1 claims
- 0271US5786931APhase grating and method of producing phase gratingHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Jul 28, 1998·32 cites·11 claims
- 0368US6445456B2Photoelectric position measuring deviceJOHANNAS HEIDENHAIN GMBH DR·Filed 1997·Granted Sep 3, 2002·31 cites·21 claims
- 0466US6671092B2Reflective measuring scale graduation and method for its manufactureHEIDENHAIN GMBH DR JOHANNES·Filed 2001·Granted Dec 30, 2003·11 cites·28 claims
- 0566US5880882AScale and method for making a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Mar 9, 1999·24 cites·14 claims
- 0656US7312878B2Method for manufacturing a scale, a scale manufactured according to the method and a position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2002·Granted Dec 25, 2007·5 cites·20 claims
- 0753US4522862AHigh resolution recording medium and method for producing sameHEIDENHAIN GMBH DR JOHANNES·Filed 1982·Granted Jun 11, 1985·13 cites·18 claims
- 0837US4431695AHigh resolution recording mediumHEIDENHAIN GMBH DR JOHANNES·Filed 1981·Granted Feb 14, 1984·6 cites·19 claims
- 0936US6800404B2Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the methodHEIDENHAIN GMBH DR JOHANNES·Filed 2002·Granted Oct 5, 2004·0 cites·13 claims
- 1035US2004090677A1Material measure in the form of an amplitude grating, as well as a position measuring systemFiled 2003·Application pending·0 cites
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