Inventor · disambiguated record
Yoshitaka Fujiishi
Also filed as: FUJIISHI YOSHITAKA
10 granted patents·3 pending applications·34 citations·filing 1999–2025
84Inventor score
Files withAP MEMORY TECH CORP4RENESAS TECH CORP4MITSUBISHI ELECTRIC CORP3SATO HIDENORI1ZENTEL JAPAN CORP1
Top patents by PatentIndex Score
13 records- 0188US7348235B2Semiconductor device and method of manufacturing the sameRENESAS TECH CORP·Filed 2006·Granted Mar 25, 2008·16 cites·8 claims
- 0271US2025261386A1Capacitor device and manufacturing method thereforAP MEMORY TECH CORP·Filed 2025·Application pending·0 cites
- 0366US11038012B2Capacitor device and manufacturing method thereforZENTEL JAPAN CORP·Filed 2017·Granted Jun 15, 2021·1 cites·18 claims
- 0460US12317521B2Capacitor device and manufacturing method thereforAP MEMORY TECH CORP·Filed 2020·Granted May 27, 2025·0 cites·12 claims
- 0557US6743693B2Method of manufacturing semiconductor memoryRENESAS TECH CORP·Filed 2002·Granted Jun 1, 2004·9 cites·20 claims
- 0655US10978413B2Circuit system having compact decoupling structureAP MEMORY TECH CORP·Filed 2019·Granted Apr 13, 2021·0 cites·6 claims
- 0753US8106437B2Semiconductor storage deviceSATO HIDENORI·Filed 2005·Granted Jan 31, 2012·2 cites·9 claims
- 0850US6703287B2Production method for shallow trench insulationRENESAS TECH CORP·Filed 2001·Granted Mar 9, 2004·3 cites·4 claims
- 0948US6828636B2Semiconductor device isolated resistive zoneRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·2 cites·7 claims
- 1048US2019198460A1Circuit system having compact decoupling structureAP MEMORY TECH CORP·Filed 2017·Application pending·0 cites
- 1136US2003022449A1Method of manufacturing a semiconductor device having a trench isolation structureMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1233US6596582B2Method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jul 22, 2003·0 cites·3 claims
- 1331US6455381B1Method of manufacturing a semiconductor device having a trench isolation structureMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Sep 24, 2002·1 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →