Inventor · disambiguated record
Sybren Sijbrandij
Also filed as: SIJBRANDIJ SYBREN · SIJBRANDIJ SYBREN J
5 granted patents·1 pending application·11 citations·filing 2004–2023
69Inventor score
Top patents by PatentIndex Score
6 records- 0167US8399834B2Isotope ion microscope methods and systemsNOTTE IV JOHN·Filed 2009·Granted Mar 19, 2013·2 cites·25 claims
- 0266US7727681B2Electron beam processing for mask repairFEI CO·Filed 2004·Granted Jun 1, 2010·9 cites·14 claims
- 0354US2023402251A1Gas injection subsystem for use in an inspection system to inspect a sample by use of charged particles and inspection system having such gas injection subsystemZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 0453US8648299B2Isotope ion microscope methods and systemsNOTTE IV JOHN A·Filed 2013·Granted Feb 11, 2014·0 cites·18 claims
- 0544US8669525B2Sample inspection methods, systems and componentsSIJBRANDIJ SYBREN·Filed 2009·Granted Mar 11, 2014·0 cites·29 claims
- 0642US10037862B2Charged particle detecting device and charged particle beam system with sameCARL ZEISS MICROSCOPY LLC·Filed 2016·Granted Jul 31, 2018·0 cites·20 claims
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