Inventor · disambiguated record
Trudo Clarysse
Also filed as: CLARYSSE TRUDO
6 granted patents·37 citations·filing 1997–2012
78Inventor score
Top patents by PatentIndex Score
6 records- 0164US7133128B2System and method for measuring properties of a semiconductor substrate in a non-destructive wayIMEC INTER UNI MICRO ELECTR·Filed 2003·Granted Nov 7, 2006·6 cites·27 claims
- 0259US8364428B2Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductorIMEC·Filed 2009·Granted Jan 29, 2013·5 cites·18 claims
- 0352US5995912ADatabase and method for measurement correction for cross-sectional carrier profiling techniquesIMEC VZW·Filed 1997·Granted Nov 30, 1999·22 cites·16 claims
- 0447US8717570B2Method for determining the active doping concentration of a doped semiconductor regionIMEC·Filed 2012·Granted May 6, 2014·0 cites·10 claims
- 0547US7751035B2Method and device to quantify active carrier profiles in ultra-shallow semiconductor structuresIMEC·Filed 2008·Granted Jul 6, 2010·1 cites·24 claims
- 0643US8314628B2Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrateCLARYSSE TRUDO·Filed 2007·Granted Nov 20, 2012·3 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →