Inventor · disambiguated record
Kouichi Kanemoto
Also filed as: KANEMOTO KOUICHI
12 granted patents·3 pending applications·488 citations·filing 1999–2007
94Inventor score
Top patents by PatentIndex Score
15 records- 0197US7234644B2IC cardRENESAS TECH CORP·Filed 2006·Granted Jun 26, 2007·51 cites·36 claims
- 0296US7552876B2IC cardRENESAS TECH CORP·Filed 2007·Granted Jun 30, 2009·42 cites·24 claims
- 0394US6945465B2Integrated circuit card having staggered sequences of connector terminalsHITACHI LTD·Filed 2001·Granted Sep 20, 2005·83 cites·8 claims
- 0492US7055757B2IC cardRENESAS TECH CORP·Filed 2004·Granted Jun 6, 2006·50 cites·34 claims
- 0592US6492727B2Semiconductor deviceHITACHI LTD·Filed 2001·Granted Dec 10, 2002·55 cites·7 claims
- 0691US7048197B2IC cardRENESAS TECH CORP·Filed 2004·Granted May 23, 2006·48 cites·32 claims
- 0784US6924547B2Memory cardRENESAS TECH CORP·Filed 2003·Granted Aug 2, 2005·37 cites·14 claims
- 0883US6531773B2Semiconductor deviceHITACHI LTD·Filed 2001·Granted Mar 11, 2003·26 cites·41 claims
- 0983US6410987B1Semiconductor device and a method of manufacturing the same and an electronic deviceHITACHI LTD·Filed 1999·Granted Jun 25, 2002·65 cites·12 claims
- 1073US7303138B2Integrated circuit card having staggered sequences of connector terminalsRENESAS TECH CORP·Filed 2006·Granted Dec 4, 2007·6 cites·20 claims
- 1173US6501173B2Semiconductor deviceHITACHI LTD·Filed 2001·Granted Dec 31, 2002·14 cites·13 claims
- 1264US6501183B2Semiconductor device and a method of manufacturing the same and an electronic deviceHITACHI LTD·Filed 2001·Granted Dec 31, 2002·11 cites·8 claims
- 1343US2004084538A1IC cardHITACHI LTD·Filed 2003·Application pending·0 cites
- 1441US2003151134A1Semiconductor deviceFiled 2002·Application pending·0 cites
- 1537US2005110127A1Semiconductor deviceRENESAS TECH CORP·Filed 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kouichi Kanemoto files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →