Inventor · disambiguated record
Hsin-Po Wang
Also filed as: WANG HSIN-P · WANG HSIN-PO
25 granted patents·5 pending applications·478 citations·filing 2002–2017
96Inventor score
Files withSYNTEST TECHNOLOGIES INC16SUNPLUS TECHNOLOGY CO LTD2TSENG CHING HUNG2CHANG CHIA-MING1SPRINGSOFT INC1
Top patents by PatentIndex Score
30 records- 0196US7058869B2Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Jun 6, 2006·119 cites·34 claims
- 0294US6954887B2Multiple-capture DFT system for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Oct 11, 2005·64 cites·33 claims
- 0393US7007213B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Feb 28, 2006·52 cites·30 claims
- 0493US6957403B2Computer-aided design system to automate scan synthesis at register-transfer levelSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Oct 18, 2005·69 cites·68 claims
- 0591US7191373B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Mar 13, 2007·48 cites·19 claims
- 0688US7331032B2Computer-aided design system to automate scan synthesis at register-transfer levelSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Feb 12, 2008·12 cites·11 claims
- 0787US9110139B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2014·Granted Aug 18, 2015·4 cites·21 claims
- 0886US7552373B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Jun 23, 2009·36 cites·44 claims
- 0984US9121902B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2014·Granted Sep 1, 2015·3 cites·30 claims
- 1079US7450482B2Method for optimizing write parameters of optical storage medium and recording device thereforSUNPLUS TECHNOLOGY CO LTD·Filed 2005·Granted Nov 11, 2008·5 cites·20 claims
- 1178US7444567B2Method and apparatus for unifying self-test with scan-test during prototype debug and production testSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Oct 28, 2008·17 cites·18 claims
- 1277US8086982B2Methods and systems for reducing clock skew in a gated clock treeCHANG CHIA-MING·Filed 2009·Granted Dec 27, 2011·11 cites·18 claims
- 1376US9057763B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jun 16, 2015·2 cites·98 claims
- 1476US9026875B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted May 5, 2015·2 cites·55 claims
- 1575US7779323B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2008·Granted Aug 17, 2010·5 cites·21 claims
- 1675US7461310B2IC functional and delay fault testingSPRINGSOFT INC·Filed 2006·Granted Dec 2, 2008·8 cites·23 claims
- 1774US8015522B2System for implementing post-silicon IC design changesSPRINGSOFT USA INC·Filed 2008·Granted Sep 6, 2011·11 cites·16 claims
- 1868US8769359B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jul 1, 2014·1 cites·30 claims
- 1968US7904773B2Multiple-capture DFT system for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2008·Granted Mar 8, 2011·4 cites·34 claims
- 2064US8543950B2Computer-aided design system to automate scan synthesis at register-transfer levelWANG LAUNG-TERNG L-T·Filed 2012·Granted Sep 24, 2013·1 cites·4 claims
- 2159US8990756B2Gateway model routing with slits on wiresSYNOPSYS TAIWAN CO LTD·Filed 2013·Granted Mar 24, 2015·1 cites·48 claims
- 2259US7721173B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2009·Granted May 18, 2010·3 cites·47 claims
- 2353US9696377B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECH INC·Filed 2015·Granted Jul 4, 2017·0 cites·12 claims
- 2449US10990743B2Creating gateway model routing sub-templatesSYNOPSYS INC·Filed 2017·Granted Apr 27, 2021·0 cites·42 claims
- 2543US7808871B2Power control apparatus and method for an optical driveSUNPLUS TECHNOLOGY CO LTD·Filed 2007·Granted Oct 5, 2010·0 cites·8 claims
- 2638US2008082880A1Method of testing high-speed ic with low-speed ic testerWANG HSIN-PO·Filed 2006·Application pending·0 cites
- 2735US2012212513A1Method Of Improving Operation Of Handheld Pointer Device In A Display ScreenTSENG CHING-HUNG·Filed 2011·Application pending·0 cites
- 2835US2004153926A1Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuitFiled 2003·Application pending·0 cites
- 2934US2013314318A1Method of improving cursor operation of handheld pointer device in a display and handheld pointer device with improved cursor operationTSENG CHING-HUNG·Filed 2012·Application pending·0 cites
- 3030US2002194558A1Method and system to optimize test cost and disable defects for scan and BIST memoriesFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →