Inventor · disambiguated record
Masakazu Yanase
Also filed as: YANASE MASAKAZU
3 granted patents·2 pending applications·16 citations·filing 2010–2012
65Inventor score
Top patents by PatentIndex Score
5 records- 0179US8995747B2Methods, systems and apparatus for defect detection and classificationXU XINYU·Filed 2010·Granted Mar 31, 2015·7 cites·14 claims
- 0279US8331650B2Methods, systems and apparatus for defect detectionYUAN CHANG·Filed 2010·Granted Dec 11, 2012·7 cites·24 claims
- 0353US8971632B2System for feature detection for low contrast imagesYANASE MASAKAZU·Filed 2010·Granted Mar 3, 2015·2 cites·8 claims
- 0433US2014203815A1Wiring fault detection method and wiring fault detection apparatusYANASE MASAKAZU·Filed 2012·Application pending·0 cites
- 0531US2014184784A1Defect inspection device and defect inspection methodYANASE MASAKAZU·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →