Inventor · disambiguated record
Yasuhira Nagakubo
Also filed as: NAGAKUBO YASUHIRA
19 granted patents·56 citations·filing 2003–2016
92Inventor score
Top patents by PatentIndex Score
19 records- 0185US9721752B2Sample holder and charged particle deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 1, 2017·3 cites·8 claims
- 0285US8878144B2Electron microscope and sample holderYAGUCHI TOSHIE·Filed 2010·Granted Nov 4, 2014·9 cites·14 claims
- 0382US8604429B2Electron beam device and sample holding device for electron beam deviceYAGUCHI TOSHIE·Filed 2010·Granted Dec 10, 2013·7 cites·12 claims
- 0481US8853648B2Sample holder, method for use of the sample holder, and charged particle deviceNAGAKUBO YASUHIRA·Filed 2010·Granted Oct 7, 2014·5 cites·12 claims
- 0577US7700927B2Heating stage for a micro-sampleHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 20, 2010·5 cites·14 claims
- 0676US10068745B2Charged particle beam device and sample holder for charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 4, 2018·3 cites·10 claims
- 0776US9558910B2Sample holder for electron microscopeHITACHI HIGH TECH CORP·Filed 2012·Granted Jan 31, 2017·3 cites·9 claims
- 0875US8729497B2Sample device for charged particle beamNAGAKUBO YASUHIRA·Filed 2011·Granted May 20, 2014·4 cites·15 claims
- 0969US10204761B2Charged particle beam device, electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 12, 2019·2 cites·16 claims
- 1068US10083814B2Electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 25, 2018·2 cites·13 claims
- 1165US9449786B2Charged particle radiation device and specimen preparation method using said deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 20, 2016·1 cites·13 claims
- 1264US10658150B2Cryostation systemHITACHI HIGH TECH CORP·Filed 2015·Granted May 19, 2020·1 cites·9 claims
- 1361US9099281B2Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatusYAGUCHI TOSHIE·Filed 2010·Granted Aug 4, 2015·1 cites·28 claims
- 1458US6972405B2Nanoscale standard sample and its manufacturing methodHITACHI SCIENCE SYSTEMS LTD·Filed 2003·Granted Dec 6, 2005·3 cites·11 claims
- 1555US9378922B2Electron microscope and electron microscope sample retaining deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 28, 2016·0 cites·32 claims
- 1650US11177109B2Specimen holder and charged particle beam device provided with sameHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 16, 2021·0 cites·26 claims
- 1742US9543112B2Specimen cryo holder and dewarHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 10, 2017·0 cites·9 claims
- 1837USD651226SSample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted Dec 27, 2011·4 cites·1 claims
- 1933USD660335SFixation device for a sample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted May 22, 2012·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →