Inventor · disambiguated record
Koung-Su Shin
Also filed as: SHIN KOUNG-SU
5 granted patents·15 citations·filing 2003–2007
73Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0167US7601555B2Wafer inspection system and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 13, 2009·6 cites·18 claims
- 0252US7280233B2Method and apparatus for inspecting an edge exposure area of a waferSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Oct 9, 2007·4 cites·21 claims
- 0351US6815236B2Method of measuring a concentration of a material and method of measuring a concentration of a dopant of a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 9, 2004·3 cites·14 claims
- 0448US7274471B2Systems and methods for measuring distance of semiconductor patternsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 25, 2007·2 cites·23 claims
- 0540US7646478B2Apparatus and method for examining spectral characteristics of transmitted light through an objectSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jan 12, 2010·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →