Inventor · disambiguated record
Yuri Vorobyev
Also filed as: VOROBYEV YURI
7 granted patents·3 pending applications·141 citations·filing 2003–2021
85Inventor score
Top patents by PatentIndex Score
10 records- 0191US6989675B2Method and apparatus for precision measurement of film thicknessMULTIMETRIXS LLC·Filed 2003·Granted Jan 24, 2006·59 cites·32 claims
- 0281US6842025B2Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatmentMULTIMETRIXS L L C·Filed 2003·Granted Jan 11, 2005·26 cites·46 claims
- 0377US6815958B2Method and apparatus for measuring thickness of thin films with improved accuracyMULTIMETRIXS LLC·Filed 2003·Granted Nov 9, 2004·18 cites·19 claims
- 0475US6891380B2System and method for measuring characteristics of materials with the use of a composite sensorMULTIMETRIXS LLC·Filed 2003·Granted May 10, 2005·21 cites·13 claims
- 0575US6801044B2Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objectsFiled 2003·Granted Oct 5, 2004·17 cites·17 claims
- 0653US11817570B2Method of manufacturing a solid-state lithium battery and a battery manufactured by the methodSADEGHI ALI·Filed 2021·Granted Nov 14, 2023·0 cites·18 claims
- 0752US11817550B2Method of synthesizing a solid-state electrolyte for use in a lithium-ion batterySADEGHI ALI·Filed 2021·Granted Nov 14, 2023·0 cites·2 claims
- 0842US2006056488A1Method and apparatus for measuring temperature with the use of an inductive sensorSURNAME BORIS·Filed 2004·Application pending·0 cites
- 0935US2021126238A1Method of Manufacturing Electrode Materials by Using Treated Carbon Nanotube TapesSADEGHI ALI·Filed 2019·Application pending·0 cites
- 1034US2004227524A1Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracyFiled 2003·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yuri Vorobyev files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →