Inventor · disambiguated record
Po-Shi Yao
Also filed as: YAO PO-SHI
3 granted patents·13 citations·filing 2011–2014
62Inventor score
Top patents by PatentIndex Score
3 records- 0185US8832933B2Method of fabricating a semiconductor test probe headKUO YUNG-HSIN·Filed 2011·Granted Sep 16, 2014·10 cites·19 claims
- 0271US9417263B2Testing probe head for wafer level testing, and test probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 16, 2016·3 cites·18 claims
- 0341US9891273B2Test structures and testing methods for semiconductor devicesKUO YUNG HSIN·Filed 2011·Granted Feb 13, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →