Inventor · disambiguated record

Steven Michael Kientz

Also filed as: KIENTZ STEVEN M · KIENTZ STEVEN MICHAEL

55 granted patents·17 pending applications·161 citations·filing 2002–2025

97Inventor score

Technology areasG06F G11C G11B G06K Y02D

Files withMICRON TECHNOLOGY INC61 ORACLE AMERICA INC3 STORAGE TECHNOLOGY CORP3 MICRON TECHNOLGY INC2 KIENTZ STEVEN MICHAEL1

Top patents by PatentIndex Score

72 records

0198US11217320B1Bin placement according to program-erase cyclesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 4, 2022·17 cites·20 claims
0297US11404139B2Smart sampling for block family scanMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·6 cites·20 claims
0396US11886726B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 30, 2024·3 cites·20 claims
0496US11573720B2Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 7, 2023·5 cites·20 claims
0595US11842061B2Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 12, 2023·3 cites·18 claims
0695US11301382B2Write data for bin resynchronization after power lossMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·4 cites·20 claims
0795US8824083B1Calibration system for limiting tape head assembly positioning errors during data writing and reading of tape in tape driveORACLE INT CORP·Filed 2013·Granted Sep 2, 2014·29 cites·20 claims
0894US7986485B2Servo writer providing a pre-writing, longitudinal magnetic bias in a magnetically unoriented tape supplyORACLE AMERICA INC·Filed 2009·Granted Jul 26, 2011·20 cites·12 claims
0993US11886712B2Die family management on a memory device using block family error avoidanceMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 30, 2024·2 cites·20 claims
1093US11231863B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 25, 2022·3 cites·16 claims
1191US7227721B1Multi-directional cartridge memory antenna designsSTORAGE TECHNOLOGY CORP·Filed 2003·Granted Jun 5, 2007·34 cites·29 claims
1288US12210759B2Threshold voltage bin calibration at memory device power upMICRON TECHNOLOGY INC·Filed 2024·Granted Jan 28, 2025·1 cites·20 claims
1388US11693745B2Error-handling flows in memory devices based on binsMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 4, 2023·2 cites·20 claims
1487US2025362823A1Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
1585US11922041B2Threshold voltage bin calibration at memory device power upMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 5, 2024·1 cites·20 claims
1685US2025378896A1Adaptive calibration for threshold voltage offset binsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
1783US6934115B1Band identification using a single C-core servo write head for timing based servo patternsSTORAGE TECHNOLOGY CORP·Filed 2002·Granted Aug 23, 2005·17 cites·18 claims
1883US2025335128A1Charge loss mitigation throughout memory device lifecycle by proactive window shiftMICRON TECHNOLGY INC·Filed 2025·Application pending·0 cites
1983US2025372188A1Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributionsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
2082US12307111B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted May 20, 2025·0 cites·20 claims
2180US12353771B2Charge loss mitigation throughout memory device lifecycle by proactive window shiftMICRON TECHNOLGY INC·Filed 2024·Granted Jul 8, 2025·0 cites·20 claims
2279US12482530B2Tracking and refreshing state metrics in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 25, 2025·0 cites·20 claims
2379US12423013B2Open block family duration limited by temperature variationMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
2479US12223190B2Measurement of representative charge loss in a block to determine charge loss stateMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 11, 2025·0 cites·20 claims
2578US2025244898A1Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
2678US2025181259A1Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
2777US12266420B2Temperature-compensated time estimate for a block to reach a uniform charge loss stateMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 1, 2025·0 cites·20 claims
2877US7085091B1Reducing tape media damage in data regionsSTORAGE TECHNOLOGY CORP·Filed 2003·Granted Aug 1, 2006·11 cites·16 claims
2976US12322473B2Determining read voltage offset in memory devicesMICRON TECHNOLOGY INC·Filed 2024·Granted Jun 3, 2025·0 cites·20 claims
3076US12293099B2Open block family duration limited by time and temperatureMICRON TECHNOLOGY INC·Filed 2023·Granted May 6, 2025·0 cites·20 claims
3176US2025117148A1Threshold voltage bin calibration at memory device power upMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
3274US11955194B2Tracking and refreshing state metrics in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
3374US11914890B2Trim value loading management in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 27, 2024·0 cites·20 claims
3473US11797205B2Measurement of representative charge loss in a block to determine charge loss stateMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 24, 2023·0 cites·20 claims
3572US11977774B2Charge loss mitigation throughout memory device lifecycle by proactive window shiftMICRON TECHNOLOGY INC·Filed 2022·Granted May 7, 2024·0 cites·20 claims
3672US2025147683A1Measurement of representative charge loss in a block to determine charge loss stateMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
3771US11862274B2Determination of state metrics of memory sub-systems following power eventsMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 2, 2024·0 cites·20 claims
3871US11853556B2Combining sets of memory blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
3971US2025029639A1Adaptive temperature compensation for a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
4071US2025006281A1Program continuation strategies after memory device power lossMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
4170US12431205B2Adaptive calibration for threshold voltage offset binsMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 30, 2025·0 cites·20 claims
4270US11709775B2Write data for bin resynchronization after power lossMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·0 cites·20 claims
4370US2024386936A1Two-stage voltage calibration upon power-up of memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
4469US8014102B2Data storage tape for minimized damageORACLE AMERICA INC·Filed 2007·Granted Sep 6, 2011·1 cites·20 claims
4569US7697229B2Method and system for writing information to a tape cartridgeSUN MICROSYSTEMS INC·Filed 2008·Granted Apr 13, 2010·1 cites·17 claims
4668US12424287B2Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributionsMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
4768US11675511B2Associating multiple cursors with block family of memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 13, 2023·0 cites·20 claims
4867US11721409B2Smart sampling for block family scanMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 8, 2023·0 cites·20 claims
4967US11664080B2Bin placement according to program-erase cyclesMICRON TECHNOLOGY INC·Filed 2021·Granted May 30, 2023·0 cites·20 claims
5067US11636913B2Tracking and refreshing state metrics in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 25, 2023·0 cites·20 claims

Showing the top 50 of 72 patent records by PatentIndex Score.

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →