Inventor · disambiguated record
Mitsuyo Asano
Also filed as: ASANO MITSUYO
6 granted patents·1 pending application·114 citations·filing 1994–2024
82Inventor score
Top patents by PatentIndex Score
7 records- 0193US7673281B2Pattern evaluation method and evaluation apparatus and pattern evaluation programTOSHIBA KK·Filed 2007·Granted Mar 2, 2010·21 cites·13 claims
- 0293US6335129B1Method for repairing pattern defect, photo mask using the method, and semiconductor device manufacturing method employing the photo maskTOSHIBA KK·Filed 2000·Granted Jan 1, 2002·70 cites·20 claims
- 0391US7313781B2Image data correction method, lithography simulation method, image data correction system, program, mask and method of manufacturing a semiconductor deviceTOSHIBA KK·Filed 2005·Granted Dec 25, 2007·14 cites·18 claims
- 0466US8121387B2Mask pattern verifying methodASANO MITSUYO·Filed 2008·Granted Feb 21, 2012·5 cites·15 claims
- 0558US2024320391A1Inspection method, inspection program, data creation method, and storage mediumKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0654US11256947B2Pattern shape measuring methodTOSHIBA MEMORY CORP·Filed 2019·Granted Feb 22, 2022·0 cites·10 claims
- 0732US5459772AExternal apparatus for monitoring a communication systemFUJITSU LTD·Filed 1994·Granted Oct 17, 1995·4 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →