Inventor · disambiguated record
Koichi Morino
Also filed as: MORINO KOICHI
11 granted patents·1 pending application·55 citations·filing 2005–2011
88Inventor score
Top patents by PatentIndex Score
12 records- 0185US7394307B2Voltage regulator having reverse voltage protection and reverse current preventionRICOH KK·Filed 2005·Granted Jul 1, 2008·14 cites·5 claims
- 0277US8975939B2Voltage clamp circuit and integrated circuit incorporating sameNEGORO TAKAAKI·Filed 2011·Granted Mar 10, 2015·4 cites·9 claims
- 0377US8098057B2Constant voltage circuit including supply unit having plural current sourcesMORINO KOICHI·Filed 2009·Granted Jan 17, 2012·11 cites·10 claims
- 0472US8575906B2Constant voltage regulatorMORINO KOICHI·Filed 2011·Granted Nov 5, 2013·4 cites·11 claims
- 0568US7974060B2Overcurrent limitation and output short-circuit protection circuit, voltage regulator using overcurrent limitation and output short-circuit protection circuit, and electronic equipmentRICOH CO LTD·Filed 2008·Granted Jul 5, 2011·7 cites·9 claims
- 0668US7863942B2Voltage detecting circuitRICOH CO LTD·Filed 2009·Granted Jan 4, 2011·4 cites·14 claims
- 0767US8531215B2Voltage detectorMORINO KOICHI·Filed 2010·Granted Sep 10, 2013·3 cites·16 claims
- 0866US7728566B2Voltage regulatorRICOH KK·Filed 2008·Granted Jun 1, 2010·5 cites·9 claims
- 0955US8525580B2Semiconductor circuit and constant voltage regulator employing sameMORINO KOICHI·Filed 2011·Granted Sep 3, 2013·2 cites·15 claims
- 1055US7885048B2Semiconductor device and an electronic apparatus incorporating the semiconductor deviceRICOH CO LTD·Filed 2007·Granted Feb 8, 2011·1 cites·10 claims
- 1139US8917103B2Device and method for testing semiconductor deviceMORINO KOICHI·Filed 2011·Granted Dec 23, 2014·0 cites·7 claims
- 1235US2005264971A1Semiconductor integrated circuit apparatus having overheat protection circuit and overheat protection methodMORINO KOICHI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →