Inventor · disambiguated record
James P. Fulton
Also filed as: FULTON JAMES · FULTON JAMES P · FULTON JAMES PAUL
12 granted patents·400 citations·filing 1992–2000
94Inventor score
Top patents by PatentIndex Score
12 records- 0184US6545467B1Contoured surface eddy current inspection systemGEN ELECTRIC·Filed 2000·Granted Apr 8, 2003·26 cites·18 claims
- 0282US5698977AEddy current method for fatigue testingUS ARMY·Filed 1995·Granted Dec 16, 1997·56 cites·7 claims
- 0381US5617024AFlux focusing eddy current probeUS ARMY·Filed 1996·Granted Apr 1, 1997·57 cites·17 claims
- 0479US5648721ARotating flux-focusing eddy current probe for flaw detectionUS ARMY·Filed 1994·Granted Jul 15, 1997·49 cites·5 claims
- 0576US5493511AHigh speed thin plate fatigue crack monitorNASA·Filed 1992·Granted Feb 20, 1996·38 cites·25 claims
- 0668US5847562AThickness gauging of single-layer conductive materials with two-point non linear calibration algorithmNASA·Filed 1997·Granted Dec 8, 1998·30 cites·16 claims
- 0767US6215379B1Shunt for indirectly heated bimetallic stripGEN ELECTRIC·Filed 1999·Granted Apr 10, 2001·21 cites·8 claims
- 0860US6054210AMolded magnetic articleNASA·Filed 1997·Granted Apr 25, 2000·13 cites·9 claims
- 0959US5942894ARadially focused eddy current sensor for detection of longitudinal flaws in metallic tubesNASA·Filed 1995·Granted Aug 24, 1999·23 cites·20 claims
- 1054US5801532AHand-holdable eddy-current probeGEN ELECTRIC·Filed 1997·Granted Sep 1, 1998·18 cites·18 claims
- 1146US5895871AFinger controlled inspection apparatusGEN ELECTRIC·Filed 1997·Granted Apr 20, 1999·36 cites·14 claims
- 1244US6029530AFinger controlled inspection apparatusGEN ELECTRIC·Filed 1998·Granted Feb 29, 2000·33 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →