Inventor · disambiguated record
Toyoo Iida
Also filed as: IIDA TOYOO
10 granted patents·5 pending applications·56 citations·filing 2001–2019
85Inventor score
Top patents by PatentIndex Score
15 records- 0181US10407250B2Image processing system, image processing apparatus, workpiece pickup method, and workpiece pickup programOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Sep 10, 2019·4 cites·12 claims
- 0281US8825452B2Model producing apparatus, model producing method, and computer-readable recording medium in which model producing program is storedSHONO KAZUHIRO·Filed 2011·Granted Sep 2, 2014·11 cites·12 claims
- 0369US6798928B2Image recording apparatusOMRON TATEISI ELECTRONICS CO·Filed 2001·Granted Sep 28, 2004·17 cites·6 claims
- 0466US10805546B2Image processing system, image processing device, and image processing programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Oct 13, 2020·1 cites·20 claims
- 0553US7027082B2Image recording apparatus and image recording systemOMRON TATEISI ELECTRONICS CO·Filed 2001·Granted Apr 11, 2006·6 cites·13 claims
- 0652US7263217B2Three-dimensional monitoring apparatusOMRON TATEISI ELECTRONICS CO·Filed 2003·Granted Aug 28, 2007·17 cites·6 claims
- 0750US10867225B2Measurement system and measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Dec 15, 2020·0 cites·16 claims
- 0847US11745352B2Vision sensor system, control method, and non-transitory computer readable storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Sep 5, 2023·0 cites·19 claims
- 0945US11093730B2Measurement system and measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Aug 17, 2021·0 cites·14 claims
- 1044US11023706B2Measurement system and measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Jun 1, 2021·0 cites·19 claims
- 1140US2007093987A1Knowledge generation support system, parameter search method and program productOMRON TATEISI ELECTRONICS CO·Filed 2005·Application pending·0 cites
- 1238US2010156896A1Method of creating three-dimensional model and object recognizing deviceOMRON TATEISI ELECTRONICS CO·Filed 2009·Application pending·0 cites
- 1337US2017116738A1Three-dimensional shape measurement device, three-dimensional shape measurement system, program, computer-readable storage medium, and three-dimensional shape measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Application pending·0 cites
- 1435US2004227816A1Intruding object monitoring systemOMRON TATEISI ELECTRONICS CO·Filed 2004·Application pending·0 cites
- 1529US2007189546A1Method of extracting, device for extracting and device for inspecting abnormal soundOMRON TATEISI ELECTRONICS CO·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Toyoo Iida files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →