Inventor · disambiguated record
Hideo Kanda
Also filed as: KANDA HIDEO
17 granted patents·4 pending applications·162 citations·filing 1975–2015
90Inventor score
Top patents by PatentIndex Score
21 records- 0197US9279957B2Imaging lens and imaging apparatus including the imaging lensFUJIFILM CORP·Filed 2014·Granted Mar 8, 2016·130 cites·11 claims
- 0271US9279962B2Imaging lens and imaging apparatus equipped with the imaging lensFUJIFILM CORP·Filed 2014·Granted Mar 8, 2016·2 cites·20 claims
- 0360US9529177B2Imaging lens and imaging apparatus equipped with the imaging lensFUJIFILM CORP·Filed 2015·Granted Dec 27, 2016·1 cites·19 claims
- 0454US9329363B2Imaging lens and imaging apparatus equipped with the imaging lensFUJIFILM CORP·Filed 2014·Granted May 3, 2016·0 cites·19 claims
- 0554US6912055B2Spherical form measuring and analyzing methodFUJINON CORP·Filed 2003·Granted Jun 28, 2005·6 cites·6 claims
- 0652US9256053B2Imaging lens and imaging apparatus including the imaging lensFUJIFILM CORP·Filed 2014·Granted Feb 9, 2016·0 cites·12 claims
- 0747US6297916B1Imaging lens for interferometric deviceFUJI PHOTO OPTICAL CO LTD·Filed 2000·Granted Oct 2, 2001·2 cites·6 claims
- 0847US2010033831A1Liquid crystal sealing apparatusTAKAHASHI HIDENORI·Filed 2009·Application pending·0 cites
- 0946US9625681B2Imaging lens and imaging apparatus provided with the sameFUJIFILM CORP·Filed 2015·Granted Apr 18, 2017·0 cites·20 claims
- 1046US7092104B2Speckle interferometer apparatusFUJINON CORP·Filed 2004·Granted Aug 15, 2006·4 cites·10 claims
- 1146US6643026B2Optical system for oblique incidence interferometer and apparatus using the sameFUJI PHOTO OPTICAL CO LTD·Filed 2001·Granted Nov 4, 2003·3 cites·14 claims
- 1246US6570661B2Optical system for oblique incidence interferometer and apparatus using the sameFUJI PHOTO OPTICAL CO LTD·Filed 2000·Granted May 27, 2003·3 cites·7 claims
- 1346US3974467ALong flexible waveguideFURUKAWA ELECTRIC CO LTD·Filed 1975·Granted Aug 10, 1976·10 cites·3 claims
- 1445US9612426B2Imaging lens and imaging apparatusFUJIFILM CORP·Filed 2015·Granted Apr 4, 2017·0 cites·19 claims
- 1545US6798585B2Reference lens for interferometer and interferometer that uses itFUJI PHOTO OPTICAL CO LTD·Filed 2003·Granted Sep 28, 2004·1 cites·20 claims
- 1643US7982882B2Optical wave interference measuring apparatusFUJINON CORP·Filed 2009·Granted Jul 19, 2011·0 cites·6 claims
- 1736US8059278B2Optical wave interference measuring apparatusGE ZONGTAO·Filed 2009·Granted Nov 15, 2011·0 cites·5 claims
- 1836US6744523B2Imaging optical system for oblique incidence interferometerFUJI PHOTO OPTICAL CO LTD·Filed 2002·Granted Jun 1, 2004·0 cites·6 claims
- 1934US2011304855A1Apparatus for measuring surface misalignment and angular misalignmentUEKI NOBUAKI·Filed 2011·Application pending·0 cites
- 2028US2011304856A1Lightwave interference measurement apparatusGE ZONGTAO·Filed 2011·Application pending·0 cites
- 2125US2010231923A1Three-dimensional shape measuring method and deviceGE ZONGTAO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →