Inventor · disambiguated record
Carlos M. Chacon
Also filed as: CHACON CARLOS · CHACON CARLOS M
8 granted patents·1 pending application·178 citations·filing 1998–2015
89Inventor score
Top patents by PatentIndex Score
9 records- 0183US6664800B2Non-contact method for determining quality of semiconductor dielectricsAGERE SYSTEMS INC·Filed 2001·Granted Dec 16, 2003·28 cites·12 claims
- 0280US6265890B1In-line non-contact depletion capacitance measurement method and apparatusLUCENT TECHNOLOGIES INC·Filed 1999·Granted Jul 24, 2001·44 cites·8 claims
- 0379US6391668B1Method of determining a trap density of a semiconductor/oxide interface by a contactless charge techniqueAGERE SYST GUARDIAN CORP·Filed 2000·Granted May 21, 2002·27 cites·33 claims
- 0477US9831098B2Methods for fabricating integrated circuits using flowable chemical vapor deposition techniques with low-temperature thermal annealingGLOBALFOUNDRIES INC·Filed 2015·Granted Nov 28, 2017·3 cites·20 claims
- 0571US6255128B1Non-contact method for determining the presence of a contaminant in a semiconductor deviceLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jul 3, 2001·39 cites·14 claims
- 0669US6548422B1Method and structure for oxide/silicon nitride interface substructure improvementsAGERE SYSTEMS INC·Filed 2001·Granted Apr 15, 2003·11 cites·13 claims
- 0763US6251697B1Non-contact method for monitoring and controlling plasma charging damage in a semiconductor deviceAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jun 26, 2001·7 cites·8 claims
- 0858US6207468B1Non-contact method for monitoring and controlling plasma charging damage in a semiconductor deviceLUCENT TECHNOLOGIES INC·Filed 1998·Granted Mar 27, 2001·19 cites·3 claims
- 0941US2003186499A1Structure for oxide/silicon nitride interface substructure improvementsAGERE SYSTEMS INC·Filed 2003·Application pending·0 cites
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