Inventor · disambiguated record
Fujio Onishi
Also filed as: ONISHI FUJIO
5 granted patents·2 pending applications·29 citations·filing 2011–2023
72Inventor score
Top patents by PatentIndex Score
7 records- 0190US10168208B2Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 1, 2019·19 cites·7 claims
- 0286US8797522B2Light quantity detection method and device thereforNAMBA AKIHIRO·Filed 2011·Granted Aug 5, 2014·10 cites·12 claims
- 0359US11493430B2Automatic analyzer and optical measurement methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 8, 2022·0 cites·12 claims
- 0451US2025237669A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0540US9322711B2Light signal detecting circuit, light amount detecting device, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 26, 2016·0 cites·7 claims
- 0638US2012194939A1Patterned medium inspection method and inspection apparatusNISHIMOTO TAKUMA·Filed 2011·Application pending·0 cites
- 0731US10121631B2Charged particle beam device provided with ion pumpHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 6, 2018·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →