Inventor · disambiguated record
Christof Krampe-Zadler
Also filed as: KRAMPE-ZADLER CHRISTOF
2 granted patents·6 pending applications·10 citations·filing 2006–2010
54Inventor score
Top patents by PatentIndex Score
8 records- 0174US8451440B2Apparatus for the optical inspection of wafersHAHN KURT·Filed 2010·Granted May 28, 2013·4 cites·35 claims
- 0271US8087799B2Illumination means and inspection means having an illumination meansHAHN KURT·Filed 2008·Granted Jan 3, 2012·6 cites·21 claims
- 0347US2008144025A1Apparatus for wafer inspectionVISTEC SEMICONDUCTOR SYS GMBH·Filed 2007·Application pending·0 cites
- 0447US2008144014A1Apparatus for wafer inspectionVISTEC SEMICONDUCTOR SYS GMBH·Filed 2007·Application pending·0 cites
- 0546US2009279080A1Device and method for the inspection of defects on the edge region of a waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2009·Application pending·0 cites
- 0645US2009034832A1Device and method for scanning the whole surface of a waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Application pending·0 cites
- 0743US2006286811A1Method of optically imaging and inspecting a wafer in the context of edge bead removalVISTEC SEMICONDUCTOR SYS GMBH·Filed 2006·Application pending·0 cites
- 0842US2007013902A1Apparatus for Inspecting a WaferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →