Inventor · disambiguated record
Jin Lian
Also filed as: LIAN JIN
12 granted patents·7 pending applications·15 citations·filing 2018–2025
85Inventor score
Top patents by PatentIndex Score
19 records- 0191US10444640B2Metrology apparatus, lithographic system, and method of measuring a structureASML NETHERLANDS BV·Filed 2018·Granted Oct 15, 2019·4 cites·20 claims
- 0289US12276921B2Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology methodASML NETHERLANDS BV·Filed 2021·Granted Apr 15, 2025·2 cites·17 claims
- 0387US10788758B2Method of measuring a parameter of interest, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Sep 29, 2020·3 cites·19 claims
- 0486US10831107B2Method for of measuring a parameter relating to a structure formed using a lithographic processASML NETHERLANDS BV·Filed 2019·Granted Nov 10, 2020·3 cites·20 claims
- 0581US10656534B2Method of measuring, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2019·Granted May 19, 2020·2 cites·20 claims
- 0678US10310389B2Method of measuring, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Jun 4, 2019·1 cites·20 claims
- 0764US12346031B2Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2021·Granted Jul 1, 2025·0 cites·13 claims
- 0864US12326669B2Illumination apparatus and associated metrology and lithographic apparatusesASML NETHERLANDS BV·Filed 2023·Granted Jun 10, 2025·0 cites·19 claims
- 0962US2025330355A1Communication method and apparatus, chip, chip module, and storage mediumHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 1062US2025323769A1Reference signal transmission method and communication apparatusHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 1161US10908514B2Metrology apparatus, lithographic system, and method of measuring a structureASML NETHERLANDS BV·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims
- 1261US2025254077A1Channel information obtaining method and apparatusHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 1357US2024288782A1Metrology method and associated metrology toolASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1456US11099489B2Method of measuring a parameter of a lithographic process, metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Aug 24, 2021·0 cites·20 claims
- 1555US2024027913A1Metrology system and coherence adjustersASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1654US2024184215A1Metrology tool calibration method and associated metrology toolASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1753US11042100B2Measurement apparatus and method of measuring a targetASML NETHERLANDS BV·Filed 2019·Granted Jun 22, 2021·0 cites·13 claims
- 1848US2025167833A1Communication method and apparatusHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 1940US10705437B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Jul 7, 2020·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →